ATM test modules are designed for the integration in electronic production lines, providing automatic test handling for Functional Test, In Ciruit Test and Combi Test of PCBs and hybrids. Board style conversion is almost automatic and may be completed within one minute.
Highlights
• Dual side contacting of PCBs
• Variable adapter deviation for FCT and ICT
• Board style conversion within 1 minute
• Motor-driven PCB conveyor adjustment
• Safe contacting by means of monitored board centering pins
• Easy operation, suitable for unskilled operators
Video: Automated Testing of Printed Circuit Boards
Integration in production lines
Depending on the line requirements, the ATM system may be loaded/unloaded manually, by means of automatic loading/unloading units or In-Line. hatec also provides tunnel furnaces for hot/cold testing.
Precise and reliable contacting
The four-column actuator of the adapter guarantees precise parallel and flat contacting of the PCB, even for large boards, high throughput and high test pins count.
The variable adapter deviation offers the possibility to use long-travel spring contacts for additional FCT. Contacting of PCB edge connectors for true FCT is also possible. Monitored board centering pins do not only center the board, but prevent the fixture from closing, if the PCB has not reached its end position.
Fast board style conversion
The motor-driven PCB conveyor adjustment and the test fixture identification is controlled by means of the test program (available with bar code identification). Also the test program identification and program call is bar code driven, if required. Test fixtures are protected with a transport cover. To protect the spring contacts during transport, fixture change is only possible, if the hood is attached.
Suitable for each test system
hatec cares for the integration of your existing test system, or supplies complete solutions, including test system, according to the needs of your production line. We also take care for the test fixture, the spring contacts for all kind of applications and, if required, the test program.