hatec offers automatic In Line test handling of PCBs and assemblies for Functional- (FCT) and In Circuit Test. The concept offers unique advantages:
• Integration into existing production lines
• Controlled testing from -40 °C up to +180 °C
• No rapid temperature changes of the DUT
• Testing under well controlled temperature conditions
• Reduced energy consumption
• Little space requirement
• Easy package style conversion
The system allows continuous temperature monitoring and control of the DUT. All heating and cooling procedures are well defined and may be settled according to a gradient to avoid thermal stress due to rapid temperature changes. Multiple in line temperature chambers allow the adaption of the heating and cooling process to the current requirements.
The system provides In Line transport of the DUTs and heating /cooling. The DUT is proceeded to the test fixture. It may be used for common In Circuit testing or Functional Testing (FCT). For Functional Testing, the fixture uses special, extended probes and the fixture closes partially. It is also possible to contact edge-connectors of a device. After testing, the DUT is proceeded to the exit temperature chamber, where it is brought back to ambient temperature. The device is then moved to the system exit, available for the next step in the production line.
e-mail info: temperaturehandling@hatec.net
Direct call: +49 (0)8061 93960-0
For additional information on ambient/hot test handling, also visit on this WEB Site:
Automatic Testing of Housed Assembly Components
Automatic Testing of Flat Assembly Components (incl. Demo video)
Environmental Stress Screening / FCT, ICT (HOT/COLD)